From now on, Mr. Doctor please! 👨🎓👍
Januar 11, 2024 in Karlsruhe
We are very pleased to announce that Mr. Chia-Wei Chen, from our Visual Inspection Systems department, has just successfully completed his doctorate at the Faculty of Computer Science at the Karlsruhe Institute of Technology (KIT) with the grade »Very Good«. The title of his thesis is: »Retroreflex Ellipsometry for Nonplanar Surfaces«.
The doctorate took place with Prof. Dr.-Ing. habil. Jürgen Beyerer Institute Director, Director Fraunhofer IOSB and our department head Prof. Dr.-Ing. Thomas Längle.
Congratulations and congratulations! 👏👏👏
His work makes a decisive contribution to expanding and securing future expertise and research in the field of retro-reflection ellipsometry (RRE) at Fraunhofer IOSB. The real-time capable image acquisition and evaluation of an RRE inspection system enables the inspection of flat and curved surfaces in a continuous process.