Events 2025

On this page you will find a list of upcoming or ongoing events in which Fraunhofer IOSB's Department Visual Inspection Systems (SPR) is involved or which we organize ourselves.

You can access past events via the links in the blue box, right.

We invite you to join us - we would be delighted to meet you at one of these events!

Networking and expertise for photonics and machine vision organisations:

SpectroNet, the photonics and machine vision cluster, interested stakeholders from industry, biology, medicine, environment and security the latest developments in optical characterisation of materials.

At the virtual SpectroNet Collaboration Conference 2025, geo-, colour-, multi-, hyper- and full-spectral photonic measurement applications will be presented.

The event will take place at Fraunhofer IOSB in Karlsruhe. 

The state of the art in optical characterization of materials is advancing rapidly. New insights into the theoretical underpinnings of this research have been gained and exciting developments have been made in practice, driven by new applications and innovative sensor technologies that are constantly evolving.

The great success of past conferences proves the need for a platform to present, discuss and evaluate the latest research results in this interdisciplinary field. For this reason, the International Conference on Optical Characterization of Materials (OCM) will be held for the sixth time in March 2025.

We are represented with 1 lectures:

PAH Detection in Road Surface Residue Using Various Hyperspectral Imaging Sensors with Detection Spray Proxy

Referent: Paul Bäcker

In addition, 5 posters will be presented:

Robust model development for HSI-based characterization of post-consumer plastics

Referent: Lukas Roming

Adaptive architectures for semantic segmentation in the field of sensor-based sorting systems

Referent: Felix Kronenwett

Non-Destructive Quality Control using a Multi-Sensory Fruit Scanner with NIR and Microwaves

Referent: Anna Taphorn

Optimizing Near-Infrared Spectroscopy for On-line Grape Must Quality Assessment: Addressing the Impact of Suspended Solids

Referent: Pascal Gauweiler

Inverse rendering for material characterization

Referent: Johannes Meyer

Image Processing for Surfaces - Advances in technology not only enable ever higher inspection speeds and more compact systems, but also, in addition to the evaluation of two-dimensionally recorded textures, the complete recording of complex 3D surface structures down to the nanometer range. Furthermore, the rapid evaluation of colored, patterned, transparent, highly reflective or mirroring surfaces is possible. In the seminar, different inspection and analysis methods will be presented for this purpose.

We are involved with the following contributions:

Image acquisition in surface inspection

Thomas Längle

Lightfield technologies

Christian Kludt

Theory and methods of color measurement

Robin Gruna

Internship station with:

Inspection of transparent materials

Christian Kludt