Image Processing for Surfaces - Advances in technology not only enable ever higher inspection speeds and more compact systems, but also, in addition to the evaluation of two-dimensionally recorded textures, the complete recording of complex 3D surface structures down to the nanometer range. Furthermore, the rapid evaluation of colored, patterned, transparent, highly reflective or mirroring surfaces is possible. In the seminar, different inspection and analysis methods will be presented for this purpose.
We are involved with the following contributions:
Image acquisition in surface inspection
Thomas Längle, at November 27, 2024
Lightfield technologies
Christian Kludt, at November 27, 2024
Theory and methods of color measurement
Robin Gruna, at November 27, 2024
Internship station with:
Inspection of transparent materials
Christian Kludt, at November 28, 2024 on 09:00 am to 03:30 pm